TSMC's announcement this week marks a significant shift in the company's lithography roadmap. For years, the Taiwanese chipmaker had refrained from detailing its High-NA EUV plans, indicating that its developers believed they could extend process technology advancements without the costly scanners. However, the company acknowledged that it cannot rely on Low-NA EUV systems indefinitely.
Under the plan, TSMC will first use High-NA EUV tools with conventional 6×6-inch photomasks in 2030, achieving an 8nm single-exposure resolution compared to 13nm with current Low-NA EUV systems. A pilot line using 6×12-inch photomasks is scheduled for 2031, with full production on the larger masks targeted for 2033.
The transition to 6×12-inch photomasks is not trivial, requiring changes across the entire ecosystem — from EDA software to mask-making tools and handling systems. ASML, the Dutch lithography equipment supplier, is working with TSMC on the transition, backed by support from Intel and Samsung.
"We expect the adoption of High NA EUV to increase progressively along the device scaling roadmap, first using current 6-inch masks and then further supported by 12-inch masks, which enable greater scanning," ASML said.
When used with conventional 6×6-inch photomasks, High-NA EUV scanners have only half the exposure field of their Low-NA counterparts. This creates challenges for manufacturing very large dies, such as AI accelerators, forcing chipmakers to either stitch multiple exposure fields together or adopt multi-chiplet designs — approaches that bring their own trade-offs in productivity and power consumption.