Two-dimensional materials are atomically thin layers, such as graphene (a single layer of carbon atoms), but graphene lacks a band gap, making it unsuitable for conventional switching transistors. Monolayers of transition-metal dichalcogenides (TMDs) such as molybdenum disulfide (MoS₂) do have a band gap and are being studied for future transistors and nanoscale devices.
A longstanding problem is that when these 2D semiconductors are grown on a wafer, crystals start forming at random points, leading to multiple crystals in each region. When these crystals meet, grain boundaries form that degrade electrical performance and device uniformity. The new approach, called etching-flux-mediated single-centred nucleation (EF-SCN), uses oxygen released from an oxide barrier to create a lateral etching flux that suppresses nucleation everywhere except at the geometric centre of each patterned area.
The researchers built working field-effect transistors (FETs) using the process and reported higher charge-carrier mobility than previously achieved for selectively grown MoS₂ transistors. In a test across a two-centimetre substrate, single crystals appeared at 397 of 400 patterned sites, a yield of 99.3 per cent.
Co-author Kibum Kang, who is also co-CEO of TDS Innovation, said the ability to control where crystal growth begins could allow high-quality 2D single crystals to be formed uniformly and developed into a next-generation process that brings logic and memory closer together. Jony Jung of TDS Innovation told The Register the company aims to enable commercial use of 2D semiconductors around 2030. He added that accelerating demand from artificial intelligence, including physical AI and robotics, could help bring adoption forward, though production timing would depend on further validation.
Two-dimensional semiconductors are also being investigated for complementary field-effect transistors (CFETs), which stack n-type and p-type transistors vertically, a 3D stacking approach that has been demonstrated by IBM and Intel.